Electron Energy-Loss Spectroscopy (EELS) Study of NbOx Film for Resistive Memory Applications. (August 2015) - Zhang, Jiaming; Norris, Kate; Samuels, Katy; Ge, Ning; Zhang, Max; Park, Joonsuk; Sinclair, Robert; Gibson, Gary; Yang, J. Joshua; Li, Zhiyong; Williams, R. Stanley