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HARVARD Citation
Chen, Y. et al. (2016). Identification of Resistivity Distributions in Dielectric Layers by Measurement Model Analysis of Impedance Spectroscopy. Electrochimica acta. pp. 312-320. [Online].
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Chen, Y. et al. (2016). Identification of Resistivity Distributions in Dielectric Layers by Measurement Model Analysis of Impedance Spectroscopy. Electrochimica acta. pp. 312-320. [Online].