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HARVARD Citation
Kwon, Y. et al. (2016). Modeling of data retention statistics of phase-change memory with confined- and mushroom-type cells. Microelectronics and reliability. pp. 284-290. [Online].
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Kwon, Y. et al. (2016). Modeling of data retention statistics of phase-change memory with confined- and mushroom-type cells. Microelectronics and reliability. pp. 284-290. [Online].