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HARVARD Citation
Estrada, M. et al. (2016). Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors. Microelectronics and reliability. pp. 29-33. [Online].
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Estrada, M. et al. (2016). Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors. Microelectronics and reliability. pp. 29-33. [Online].