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HARVARD Citation
Liu, W. et al. (2015). Characterization of microvoids in thin hydrogenated amorphous silicon layers by spectroscopic ellipsometry and Fourier transform infrared spectroscopy. Scripta materialia. pp. 50-53. [Online].
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Liu, W. et al. (2015). Characterization of microvoids in thin hydrogenated amorphous silicon layers by spectroscopic ellipsometry and Fourier transform infrared spectroscopy. Scripta materialia. pp. 50-53. [Online].