On‐chip THz spectrometer for bunch compression fingerprinting at fourth‐generation light sources. (21st August 2018)

• Record Type: Journal Article
• Authors: Laabs, M.; Neumann, N.; Green, B.; Awari, N.; Deinert, J.; Kovalev, S.; Plettemeier, D.; Gensch, M.
• Is Part Of: Journal of synchrotron radiation. Volume 25:Part 5(2018)
• Page Start: 1509
• Page End: 1513
• Publication Date: 2018-08-21
• Subjects: THz -- on chip -- spectrometer -- bunch compression -- X‐ray free‐electron laser; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577518010184
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : A successful test of an on‐chip THz spectrometer that allows measurement of THz fingerprints for the purpose of bunch compression diagnostics is reported. Abstract : The layout of an integrated millimetre‐scale on‐chip THz spectrometer is presented and its peformance demonstrated. The device is based on eight Schottky‐diode detectors which are combined with narrowband THz antennas, thereby enabling the simultaneous detection of eight frequencies in the THz range on one chip. The size of the active detector area matches the focal spot size of superradiant THz radiation utilized in bunch compression monitors of modern linear electron accelerators. The 3 dB bandwidth of the on‐chip Schottky‐diode detectors is less than 10% of the center frequency and allows pulse‐resolved detection at up to 5 GHz repetition rates. The performance of a first prototype device is demonstrated at a repetition rate of 100 kHz at the quasi‐cw SRF linear accelerator ELBE operated with electron bunch charges between a few pC and 100 pC.