Investigation of the chemical stability of different Cr(VI) based compounds during regular X-ray photoelectron spectroscopy measurements. (January 2015)

• Record Type: Journal Article
• Authors: Steinberger, R.; Duchoslav, J.; Greunz, T.; Arndt, M.; Stifter, D.
• Is Part Of: Corrosion science. Volume 90(2015)
• Page Start: 562
• Page End: 571
• Publication Date: 2015-01
• Subjects: B. XPS -- C. Oxygen reduction -- C. Kinetic parameters; Corrosion and anti-corrosives -- Periodicals; 620.11223
• DOI: 10.1016/j.corsci.2014.10.049
• Languages: English
• ISSNs: 0010-938X

Abstract

Highlights: XPS study of influence of regular data acquisition on different Cr(VI) compounds. All of the investigated samples suffer sample damage, i.e. chemical decomposition. Degradation is predominantly caused by the low energy ions from dual flood gun. Photoreduction plays a minor role when using modern XPS systems with monochromator. Dichromates suffer more severe damage than their corresponding chromates. Abstract: Chromium compounds are of high importance for industrial applications, but due to their hazardous nature Cr(VI) species are subjected to strict regulations. XPS performed on these materials provides promising potential to identify the involved chemical states. However, hexavalent chromium is known to suffer degradation by decomposition, so the influence of standard XPS measurements, using a modern system with monochromatic X-rays and a dual flood gun, on the chemical stability of several Cr(VI) compounds was investigated in depth. Degradation of varying intensity is shown to be mainly induced by the dual flood gun instead of the expected photoreduction by X-rays.