Cite
HARVARD Citation
Park, S. et al. (2016). Drop-shock reliability improvement of embedded chip resistor packages through via structure modification. Microelectronics and reliability. pp. 194-200. [Online].
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Park, S. et al. (2016). Drop-shock reliability improvement of embedded chip resistor packages through via structure modification. Microelectronics and reliability. pp. 194-200. [Online].