Rearrangement of Multiferroic BiFeO3 Nanodots Smaller than 15 nm Using Atomic Force Microscopy. Issue 2 (10th December 2013)

• Record Type: Journal Article
• Authors: Meang, Wan J.; Son, Jong Y.
• Editors: Paranthaman, P.
• Is Part Of: Journal of the American Ceramic Society. Volume 97:Issue 2(2014)
• Page Start: 631
• Page End: 634
• Publication Date: 2013-12-10
• Subjects: Ceramics -- Periodicals; 620.1405
• DOI: 10.1111/jace.12674
• Languages: English
• ISSNs: 0002-7820

Abstract

Abstract : In this study, we demonstrate an atomic force microscopy process for manipulating multiferroic BiFeO3 nanodots smaller than 15 nm to desired positions on a Nb‐doped SrTiO3 substrate. For formation of the BiFeO3 nanodot array, nanocrystal movement was achieved using a +1.2 V biased conducting atomic force microscopy (CAFM) followed by nanocrystal attachment to the tip. Using this method, high‐density BiFeO3 nanodot arrays with a density greater than 0.5 Tb/in. 2 can be achieved. Perfectly flipped ferroelectric polarization with an external electric field was observed for each BiFeO3 nanodot, whose ferroelectric properties were confirmed using piezoelectric force microscopy.