Cite
HARVARD Citation
Eifert, A. et al. (n.d.). Advanced fabrication process for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes. Micron. pp. 27-35. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Eifert, A. et al. (n.d.). Advanced fabrication process for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes. Micron. pp. 27-35. [Online].