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HARVARD Citation
Tsoutsouva, M. et al. (2015). Mono-like silicon ingots grown on low angle misoriented seeds: Defect characterization by synchrotron X-ray diffraction imaging. Acta materialia. pp. 112-120. [Online].
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Tsoutsouva, M. et al. (2015). Mono-like silicon ingots grown on low angle misoriented seeds: Defect characterization by synchrotron X-ray diffraction imaging. Acta materialia. pp. 112-120. [Online].