Cite
HARVARD Citation
Aziza, H. et al. (2015). A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM. Solid-state electronics. pp. 73-78. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Aziza, H. et al. (2015). A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM. Solid-state electronics. pp. 73-78. [Online].