Cite
HARVARD Citation
Geng, W. et al. (n.d.). Polarization fatigue in antiferroelectric (Pb, La)(Zr, Ti)O3 thin films: The role of the effective strength of driving waveform. Ceramics international. pp. S289-S295. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Geng, W. et al. (n.d.). Polarization fatigue in antiferroelectric (Pb, La)(Zr, Ti)O3 thin films: The role of the effective strength of driving waveform. Ceramics international. pp. S289-S295. [Online].