Carbonization in boron-ion-implanted polymethylmethacrylate as revealed from Raman spectroscopy and electrical measurements. Issue 1 (2nd January 2016) - Kavetskyy, T.
ABSTRACT: The results of Raman spectroscopy and electrical measurements of 40 keV boron-ion-implanted polymethylmethacrylate with ion doses from 6.25 × 10 14 to 5.0 × 10 16 ions/cm 2 are reported for the first time. The Raman spectra recorded in the 400–3800 cm −1 range, showing the formation of new carbon–carbon bands for the as-implanted samples at higher ion doses (>10 16 ions/cm 2 ), are found to be an additional support for carbonization processes earlier revealed by slow positrons. The current–voltage dependences at 360 K testify also that the as-implanted samples examined with higher fluences (3.75 × 10 16 and 5.0 × 10 16 ions/cm 2 ) have created a very thin conductive layer or conductive joints due to carbonization.