Cite
HARVARD Citation
Oh, Y. et al. (2018). Impact of etch angles on cell characteristics in 3D NAND flash memory. Microelectronics journal. pp. 1-6. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Oh, Y. et al. (2018). Impact of etch angles on cell characteristics in 3D NAND flash memory. Microelectronics journal. pp. 1-6. [Online].