Grain size quantification by optical microscopy, electron backscatter diffraction, and magnetic force microscopy. (October 2017)

• Record Type: Journal Article
• Authors: Chen, Hansheng; Yao, Yin; Warner, Jacob A; Qu, Jiangtao; Yun, Fan; Ye, Zhixiao; Ringer, Simon P.; Zheng, Rongkun
• Is Part Of: Micron. Volume 101(2017)
• Page Start: 41
• Page End: 47
• Publication Date: 2017-10
• Subjects: Grain size -- Optical microscopy (OM) -- Electron backscatter diffraction (EBSD) -- Magnetic force microscopy (MFM) -- Nd-Fe-B; Microscopy -- Periodicals; Electron Probe Microanalysis -- Periodicals; Microscopy -- Periodicals; Microscopie -- Périodiques; Microscopy; Periodicals; 502.82
• DOI: 10.1016/j.micron.2017.06.001
• Languages: English
• ISSNs: 0968-4328

Abstract

Graphical abstract: Highlights: Optical microscopy, electron backscatter diffraction, and magnetic force microscopy were evaluated for grain size quantification in comparison. Potential applications of prospective techniques for grain size quantification were summarized. Additional information achieved by prospective techniques was summarized. Abstract: Quantification of microstructure, especially grain size, in polycrystalline materials is a vital aspect to understand the structure-property relationships in these materials. In this paper, representative characterization techniques for determining the grain size, including optical microscopy (OM), electron backscatter diffraction (EBSD) in the scanning electron microscopy (SEM), and atomic force microscopy/magnetic force microscopy (AFM/MFM), are thoroughly evaluated in comparison, illustrated by rare-earth sintered Nd-Fe-B permanent magnets. Potential applications and additional information achieved by using aforementioned characterization techniques have been discussed and summarized.