28‐2: A Novel OLED Display Panel with High‐Reliability Integrated Gate Driver Circuit using IGZO TFTs for Large‐Sized UHD TVs. Issue 1 (30th May 2018)

• Record Type: Journal Article
• Authors: Shin, Hong-Jae; Takasugi, Shinji; Choi, Woo-Seok; Chang, Min-Kyu; Choi, Jae-Yi; Jeon, Sang-Ki; Yun, Seong-Ho; Park, Hee-Whan; Kim, Jin-Mok; Kim, Han-Seop; Oh, Chang-Ho
• Is Part Of: Digest of technical papers. Volume 49:Issue 1(2018)
• Page Start: 358
• Page End: 361
• Publication Date: 2018-05-30
• Subjects: OLED TV -- UHD -- Large-Size -- Gate Driver -- IGZO TFT; Information display systems -- Congresses; 621.3815422
• DOI: 10.1002/sdtp.12571
• Languages: English
• ISSNs: 0097-966X

Abstract

Abstract : We present a novel OLED display panel with high‐reliability integrated gate driver circuit using IGZO TFTs. Our gate driver circuit can drive a large‐sized OLED display not only for displaying images but also for sensing TFT characteristics for external compensation. It functions correctly even when the threshold voltage of TFTs is negative by reducing leakage currents. We have achieved a life time longer than 60, 000 hours in a reliability test and successfully applied it to 55‐inch UHD, 65‐inch UHD and 55‐inch FHD OLED displays, which improves cost‐competitiveness of OLED displays against LCDs.