Cite
HARVARD Citation
Yang, Z. et al. (2018). Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process. Microelectronics journal. pp. 88-93. [Online].
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Yang, Z. et al. (2018). Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process. Microelectronics journal. pp. 88-93. [Online].