A capacitor based fast I-V characteristics tester for photovoltaic arrays. (July 2018)

• Record Type: Journal Article
• Authors: Chen, Zhicong; Lin, Wencheng; Wu, Lijun; Long, Chao; Lin, Peijie; Cheng, Shuying
• Is Part Of: Energy procedia. Volume 145(2018)
• Page Start: 381
• Page End: 387
• Publication Date: 2018-07
• Subjects: PV arrays -- I-V characteristics testing -- dynamic capacitor charging -- parameter extraction -- ABC-NMS algorithm -- partial shading; Power resources -- Congresses; Power resources -- Periodicals; Power resources; Conference proceedings; Periodicals; 333.7905
• DOI: 10.1016/j.egypro.2018.04.032
• Languages: English
• ISSNs: 1876-6102

Abstract

Abstract: In order to efficiently evaluate the operating status of photovoltaic (PV) arrays, a design of fast current-voltage (I-V) characteristic tester is proposed in this paper. The tester uses the dynamic capacitor charging method to quickly sweep I-V characteristic curves. Then, a new artificial bee colony and Nelder-Mead simplex (ABC-NMS) hybrid algorithm is used to extract parameters of the single diode model of PV arrays. The experimental results show that the tester can quickly measure high-quality I-V curves of PV array and achieve accurate model parameters extraction. In addition, the root mean square error (RMSE) of curve fitting can be used to effectively indicate the partial shading condition.