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HARVARD Citation
Chou, P. et al. (n.d.). Comprehensive dynamic on-resistance assessments in GaN-on-Si MIS-HEMTs for power switching applications. Semiconductor science and technology. p. . [Online].
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Chou, P. et al. (n.d.). Comprehensive dynamic on-resistance assessments in GaN-on-Si MIS-HEMTs for power switching applications. Semiconductor science and technology. p. . [Online].