Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. (1st August 2016)

• Record Type: Journal Article
• Authors: Yankovich, Andrew B; Zhang, Chenyu; Oh, Albert; Slater, Thomas J A; Azough, Feridoon; Freer, Robert; Haigh, Sarah J; Willett, Rebecca; Voyles, Paul M
• Is Part Of: Nanotechnology. Volume 27:Number 36(2016)
• Publication Date: 2016-08-01
• Subjects: spectrum imaging -- nano characterization -- multivariate statistical analysis -- image denoising; Nanotechnology -- Periodicals; Nanotechnology -- Periodicals; Nanotechnology; Publications périodiques; Nanotechnologies; Periodicals; 620.5
• DOI: 10.1088/0957-4484/27/36/364001
• Languages: English
• ISSNs: 0957-4484

Abstract

Abstract: Image registration and non-local Poisson principal component analysis (PCA) denoising improve the quality of characteristic x-ray (EDS) spectrum imaging of Ca-stabilized Nd2/3 TiO3 acquired at atomic resolution in a scanning transmission electron microscope. Image registration based on the simultaneously acquired high angle annular dark field image significantly outperforms acquisition with a long pixel dwell time or drift correction using a reference image. Non-local Poisson PCA denoising reduces noise more strongly than conventional weighted PCA while preserving atomic structure more faithfully. The reliability of and optimal internal parameters for non-local Poisson PCA denoising of EDS spectrum images is assessed using tests on phantom data.