Cite
HARVARD Citation
Gruber, G. et al. (2018). Impact of the NO Anneal on the Microscopic Structure and Chemical Composition of the Si‐Face 4H‐SiC/SiO2 Interface. Advanced materials interfaces. 5 (12), p. n/a. [Online].
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Gruber, G. et al. (2018). Impact of the NO Anneal on the Microscopic Structure and Chemical Composition of the Si‐Face 4H‐SiC/SiO2 Interface. Advanced materials interfaces. 5 (12), p. n/a. [Online].