Instrumentation for Reliably Determining Porous Silicon Photoluminescence Responses to Gaseous Analyte Vapors. Issue 12 (December 2016)

• Record Type: Journal Article
• Authors: Reynard, Justin M.; Van Gorder, Nathan S.; Richardson, Caley A.; Eriacho, Richie D.; Bright, Frank V.
• Is Part Of: Applied spectroscopy. Volume 70:Issue 12(2016)
• Page Start: 1974
• Page End: 1980
• Publication Date: 2016-12
• Subjects: Porous silicon -- photoluminescence -- Stern–Volmer quenching -- temperature dependence; Spectrum analysis -- Periodicals; 543.505
• DOI: 10.1177/0003702816653125
• Languages: English
• ISSNs: 0003-7028

Abstract

We report new instrumentation for rapidly and reliably measuring the temperature-dependent photoluminescence response from porous silicon as a function of analyte vapor concentration. The new system maintains the porous silicon under inert conditions and it allows on-the-fly steady-state and time-resolved photoluminescence intensity and hyper-spectral measurements between 293 K and 450 K. The new system yields reliable data at least 100-fold faster in comparison to previous instrument platforms.