From Atoms to Functional Nanomaterials: Structural Modifications as Observed Using Aberration-Corrected STEM. (8th May 2018)

• Record Type: Journal Article
• Authors: Sanchez, S. I.; Allard, L. F.; Schaal, M. T.; Tonnesen, S. M.; Le, Y.; Bradley, S. A.; Bogdan, P.L.; Gajda, G. J.
• Is Part Of: Microscopy today. Volume 26:Number 3(2018)
• Page Start: 24
• Page End: 31
• Publication Date: 2018-05-08
• Subjects: aberration-corrected scanning transmission electron microscopy (STEM), -- Pt and Pt-Re nanoparticle catalysts, -- WS2 transition metal sulfide nanostructures, -- ex situ thermal processing, -- atomic resolution imaging; Microscope and microscopy -- Periodicals; 502.8
• DOI: 10.1017/S1551929518000469
• Languages: English
• ISSNs: 1551-9295

Abstract

Abstract: Abstract: Aberration-corrected STEM has become a standard analytical technique in the field of nanoscience. As "designer materials" have become more in demand in academic circles, verification of a desired product makes atomic-resolutionanalysis mandatory. Industry currently faces the same trend where tailor-made materials are customized for a given application. Here we show several examples where quantifiable atomic-scale manipulation of nanomaterials can have a dramatic impact on structure and, by extension, functionality.