Cite
HARVARD Citation
Wang, X. et al. (n.d.). Omega–Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films. Powder diffraction. pp. S9-S15. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Wang, X. et al. (n.d.). Omega–Phi compensated GID in side inclination mode for measurement of residual stress in polycrystalline thin films. Powder diffraction. pp. S9-S15. [Online].