Large Enhancement of 2D Electron Gases Mobility Induced by Interfacial Localized Electron Screening Effect. Issue 22 (17th April 2018)
- Record Type:
- Journal Article
- Title:
- Large Enhancement of 2D Electron Gases Mobility Induced by Interfacial Localized Electron Screening Effect. Issue 22 (17th April 2018)
- Main Title:
- Large Enhancement of 2D Electron Gases Mobility Induced by Interfacial Localized Electron Screening Effect
- Authors:
- Chi, Xiao
Huang, Zhen
Asmara, Teguh C.
Han, Kun
Yin, Xinmao
Yu, Xiaojiang
Diao, Caozheng
Yang, Ming
Schmidt, Daniel
Yang, Ping
Trevisanutto, Paolo E.
Whitcher, T. J.
Venkatesan, T.
Breese, Mark B. H.
Ariando,
Rusydi, Andrivo - Abstract:
- Abstract: The interactions between delocalized and localized charges play important roles in correlated electron systems. Here, using a combination of transport measurements, spectroscopic ellipsometry (SE), and X‐ray absorption spectroscopy (XAS) supported by theoretical calculations, we reveal the important role of interfacial localized charges and their screening effects in determining the mobility of (La0.3 Sr0.7 )(Al0.65 Ta0.35 )O3 /SrTiO3 (LSAT/SrTiO3 ) interfaces. When the LSAT layer thickness reaches the critical value of 5 uc, the insulating interface abruptly becomes conducting, accompanied by the appearance of a new midgap state. This midgap state emerges at ≈1 eV below the Ti t 2g band and shows a strong character of Ti 3d xy – O 2p hybridization. Increasing the LSAT layer from 5 to 18 uc, the number of localized charges increases, resulting in an enhanced screening effect and higher mobile electron mobility. This observation contradicts the traditional semiconductor interface where the localized charges always suppress the carrier mobility. These results demonstrate a new strategy to probe localized charges and mobile electrons in correlated electronic systems and highlight the important role of screening effects from localized charges in improving the mobile electron mobility at complex oxide interfaces. Abstract : The interactions between delocalized and localized charges play important roles in correlated electron systems. From a newly designed LSAT/STO 2DGEsAbstract: The interactions between delocalized and localized charges play important roles in correlated electron systems. Here, using a combination of transport measurements, spectroscopic ellipsometry (SE), and X‐ray absorption spectroscopy (XAS) supported by theoretical calculations, we reveal the important role of interfacial localized charges and their screening effects in determining the mobility of (La0.3 Sr0.7 )(Al0.65 Ta0.35 )O3 /SrTiO3 (LSAT/SrTiO3 ) interfaces. When the LSAT layer thickness reaches the critical value of 5 uc, the insulating interface abruptly becomes conducting, accompanied by the appearance of a new midgap state. This midgap state emerges at ≈1 eV below the Ti t 2g band and shows a strong character of Ti 3d xy – O 2p hybridization. Increasing the LSAT layer from 5 to 18 uc, the number of localized charges increases, resulting in an enhanced screening effect and higher mobile electron mobility. This observation contradicts the traditional semiconductor interface where the localized charges always suppress the carrier mobility. These results demonstrate a new strategy to probe localized charges and mobile electrons in correlated electronic systems and highlight the important role of screening effects from localized charges in improving the mobile electron mobility at complex oxide interfaces. Abstract : The interactions between delocalized and localized charges play important roles in correlated electron systems. From a newly designed LSAT/STO 2DGEs system, a new interfacial midgap state is found, and localized electrons in this new state have significantly influence on electron mobility. The increasingly localized electrons amplify the electron mobility, providing a new way to improve the interfacial electronic mobility. … (more)
- Is Part Of:
- Advanced materials. Volume 30:Issue 22(2018)
- Journal:
- Advanced materials
- Issue:
- Volume 30:Issue 22(2018)
- Issue Display:
- Volume 30, Issue 22 (2018)
- Year:
- 2018
- Volume:
- 30
- Issue:
- 22
- Issue Sort Value:
- 2018-0030-0022-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2018-04-17
- Subjects:
- 2D electron gases -- highly interfacial electron mobility -- oxide heterostructures -- screening effect -- X‐ray and optical spectra
Materials -- Periodicals
Chemical vapor deposition -- Periodicals
620.11 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1521-4095 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/adma.201707428 ↗
- Languages:
- English
- ISSNs:
- 0935-9648
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 0696.897800
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 6820.xml