On the efficient simulation of electrical circuits with constant phase elements: The Warburg element as a test case. (27th April 2018)

• Record Type: Journal Article
• Authors: Athanasiou, Vasileios; Konkoli, Zoran
• Is Part Of: International journal of circuit theory and applications. Volume 46:Number 5(2018)
• Page Start: 1072
• Page End: 1090
• Publication Date: 2018-04-27
• Subjects: closure techniques -- constant phase element -- convolution integral -- electrical circuit simulator -- Warburg element; Electric circuit analysis -- Periodicals; 621.319205
• DOI: 10.1002/cta.2474
• Languages: English
• ISSNs: 0098-9886

Abstract

Summary: The constant phase Element (CPE) concept naturally emerges as a model for describing a range of electrical phenomena where ionic diffusion is involved. We suggest a new method for modelling the transient behavior of electrical circuits that contain CPE elements. Without loss of generality, we study the Warburg element to demonstrate the method, but the method can be easily extended to any CPE. Transient simulations of such elements require the numerical evaluation of a computationally expensive convolution integral that links the voltage drop across the element, with the current that passed through it. In our work we suggest a new method for reducing the computational cost of the numerical evaluation of the convolution integral. We show that the computational cost can be reduced by one order of magnitude. Abstract : In this work, we suggest a new method for simulating the transient behavior of electrical circuits that contain constant phase elements. These elements are widely used as components in equivalent circuits describing phenomena where ionic diffusion is involved, eg, in electrochemistry or solid state electronics. Transient simulation of such elements requires the numerical evaluation of a computationally expensive convolution integral that links the voltage drop across the element, with the current that passed through it. We show that the computational cost can be decreased by one order of magnitude. We do that by introducing a new technique where the convolution integral at a specific time point is numerically evaluated by reusing the calculated convolution integral at the previous time point.