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HARVARD Citation
Buchriegler, J. et al. (2018). Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts. X-ray spectrometry. pp. 327-338. [Online].
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Buchriegler, J. et al. (2018). Enhancements in full‐field PIXE imaging—Large area elemental mapping with increased lateral resolution devoid of optics artefacts. X-ray spectrometry. pp. 327-338. [Online].