Computing Crystal Size Distribution by Focused‐Beam Reflectance Measurement when Aspect Ratio Varies. Issue 6 (6th April 2018)

• Record Type: Journal Article
• Authors: Unno, Joi; Umeda, Ryuta; Hirasawa, Izumi
• Other Names: Wohlgemuth Kerstin guestEditor.
• Is Part Of: Chemical engineering & technology. Volume 41:Issue 6(2018)
• Page Start: 1147
• Page End: 1151
• Publication Date: 2018-04-06
• Subjects: Chord length distribution -- Crystallization -- Crystal size distribution -- Focused‐beam reflectance measurement; Chemical engineering -- Periodicals; Chemical processes -- Periodicals; 660.05
• DOI: 10.1002/ceat.201700615
• Languages: English
• ISSNs: 0930-7516

Abstract

Abstract: Chord length distribution (CLD) can be determined by an in‐line measuring system with focused‐beam reflectance measurement, but it can differ from crystal size distribution (CSD). However, expected values of CLD can be calculated from CSD by statistical methods and vice versa. In this study, a correlation equation between crystal size and aspect ratio during cooling crystallization was obtained and a mapping matrix was calculated based on the correlation equation. Then, the suspension obtained in cooling crystallization was sampled and CSDs were measured by microscopy at the same time that CLDs were measured with FBRM. As a result of error evaluation, transformation of CLD into CSD reduced the errors between CLDs and CSDs except in the early stage of crystallization. Abstract : In chemical industry, the crystal size distribution is a key parameter. The chord length distribution can be determined by in‐line measuring systems with focused‐beam reflectance measurement but can differ from crystal size distribution. However, expected values of chord length distribution can be calculated from the known crystal size distribution via mapping matrix and vice versa.