Cite
HARVARD Citation
Xu, P. et al. (2018). High stereographic resolution texture and residual stress evaluation using time‐of‐flight neutron diffraction. Journal of applied crystallography. 51 (3), pp. 746-760. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Xu, P. et al. (2018). High stereographic resolution texture and residual stress evaluation using time‐of‐flight neutron diffraction. Journal of applied crystallography. 51 (3), pp. 746-760. [Online].