Correcting sample drift using Fourier harmonics. (July 2018)

• Record Type: Journal Article
• Authors: Bárcena-González, G.; Guerrero-Lebrero, M.P.; Guerrero, E.; Reyes, D.F.; Braza, V.; Yañez, A.; Nuñez-Moraleda, B.; González, D.; Galindo, P.L.
• Is Part Of: Micron. Volume 110(2018)
• Page Start: 18
• Page End: 27
• Publication Date: 2018-07
• Subjects: Drift correction -- Image distortion -- Fourier analysis -- Harmonic analysis; Microscopy -- Periodicals; Electron Probe Microanalysis -- Periodicals; Microscopy -- Periodicals; Microscopie -- Périodiques; Microscopy; Periodicals; 502.82
• DOI: 10.1016/j.micron.2018.04.004
• Languages: English
• ISSNs: 0968-4328

Abstract

Highlights: A methodology to determine the drift angle using the second harmonics spots in Fourier analysis. The methodology is independent of the angle of acquisition of the image. The sum of two measurements using non-consecutive quadrants gives the best results. Drift angle calculation is more accurate by using an odd multiple of 45° in the acquisition angle. Abstract: During image acquisition of crystalline materials by high-resolution scanning transmission electron microscopy, the sample drift could lead to distortions and shears that hinder their quantitative analysis and characterization. In order to measure and correct this effect, several authors have proposed different methodologies making use of series of images. In this work, we introduce a methodology to determine the drift angle via Fourier analysis by using a single image based on the measurements between the angles of the second Fourier harmonics in different quadrants. Two different approaches, that are independent of the angle of acquisition of the image, are evaluated. In addition, our results demonstrate that the determination of the drift angle is more accurate by using the measurements of non-consecutive quadrants when the angle of acquisition is an odd multiple of 45°.