Cite
HARVARD Citation
Li, X. et al. (n.d.). Temperature dependence of dynamical permeability characterization of magnetic thin films using shorted microstrip line probe. Measurement science & technology. p. . [Online].
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Li, X. et al. (n.d.). Temperature dependence of dynamical permeability characterization of magnetic thin films using shorted microstrip line probe. Measurement science & technology. p. . [Online].