Multiband corrections for the semi-classical simulation of interband tunneling in GaAs tunnel junctions. (1st September 2017)

• Record Type: Journal Article
• Authors: Louarn, K; Claveau, Y; Hapiuk, D; Fontaine, C; Arnoult, A; Taliercio, T; Licitra, C; Piquemal, F; Bounouh, A; Cavassilas, N; Almuneau, G
• Is Part Of: Journal of physics. Volume 50:Number 38(2017)
• Publication Date: 2017-09-01
• Subjects: tunnel junctions -- multi-junction solar cells -- band-to-band tunneling -- semi-classical simulation -- k.p model -- multiband corrections; Physics -- Periodicals; 530
• DOI: 10.1088/1361-6463/aa804e
• Languages: English
• ISSNs: 0022-3727

Abstract

Abstract: The aim of this study is to investigate the impact of multiband corrections on the current density in GaAs tunnel junctions (TJs) calculated with a refined yet simple semi-classical interband tunneling model (SCITM). The non-parabolicity of the considered bands and the spin–orbit effects are considered by using a recently revisited SCITM available in the literature. The model is confronted to experimental results from a series of molecular beam epitaxy grown GaAs TJs and to numerical results obtained with a full quantum model based on the non-equilibrium Green's function formalism and a 6-band k.p Hamiltonian. We emphasize the importance of considering the non-parabolicity of the conduction band by two different measurements of the energy-dependent electron effective mass in N-doped GaAs. We also propose an innovative method to compute the non-uniform electric field in the TJ for the SCITM simulations, which is of prime importance for a successful operation of the model. We demonstrate that, when considering the multiband corrections and this new computation of the non-uniform electric field, the SCITM succeeds in predicting the electrical characteristics of GaAs TJs, and are also in agreement with the quantum model. Besides the fundamental study of the tunneling phenomenon in TJs, the main benefit of this SCITM is that it can be easily embedded into drift-diffusion software, which are the most widely-used simulation tools for electronic and opto-electronic devices such as multi-junction solar cells, tunnel field-effect transistors, or vertical-cavity surface-emitting lasers.