ELECTRON MICROSCOPY : Scanning photoelectron microscopy using a pointed capillary probe. (31st August 2017)

• Record Type: Journal Article
• Authors: Mironov, B N; Cherkun, A P; Aseyev, S A; Chekalin, S V
• Is Part Of: Quantum electronics. Volume 47:Number 8(2017)
• Page Start: 757
• Page End: 761
• Publication Date: 2017-08-31
• Subjects: Quantum electronics -- Periodicals; 537.5
• DOI: 10.1070/QEL16331
• Languages: English
• ISSNs: 1063-7818

Abstract

Abstract: The possibilities of a new type of scanning probe microscopy (SPM) for two different samples are experimentally demonstrated. The method is based on the use of a pointed capillary, which can simultaneously act as a 'classical' SPM probe and also as a controlled thin channel for transporting charged particles emitted by the surface to the detector. In the experiment, photoelectrons pass through a dielectric hollow cone probe with an aperture radius of 1 μm and detected by microchannel plates at different points of the investigated conducting surface irradiated by the second harmonic of a femtosecond Ti : sapphire laser. As a result, the sample's surface profile is visualised with a subwavelength spatial resolution. This method makes it possible to control spatially localised beams of electrons, ions, neutral atoms (molecules) and soft X-ray radiation, as well as opens a possibility for research in the field of nanoscale photodesorption of molecular ions.