A scanning transmission X‐ray microscope at the Pohang Light Source. (30th March 2018)

• Record Type: Journal Article
• Authors: Shin, Hyun-Joon; Kim, Namdong; Kim, Hee-Seob; Lee, Wol-Woo; Lee, Chae-Soon; Kim, Bongsoo
• Is Part Of: Journal of synchrotron radiation. Volume 25:Part 3(2018)
• Page Start: 878
• Page End: 884
• Publication Date: 2018-03-30
• Subjects: STXM -- spectronanoscopy -- spectromicroscopy -- soft X‐ray fluorescence; Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577518002564
• Languages: English
• ISSNs: 0909-0495

Abstract

Abstract : A scanning transmission X‐ray microscope operational at the Pohang Light Source is described. Abstract : A scanning transmission X‐ray microscope is operational at the 10A beamline at the Pohang Light Source. The 10A beamline provides soft X‐rays in the photon energy range 100–2000 eV using an elliptically polarized undulator. The practically usable photon energy range of the scanning transmission X‐ray microscopy (STXM) setup is from ∼150 to ∼1600 eV. With a zone plate of 25 nm outermost zone width, the diffraction‐limited space resolution, ∼30 nm, is achieved in the photon energy range up to ∼850 eV. In transmission mode for thin samples, STXM provides the element, chemical state and magnetic moment specific distributions, based on absorption spectroscopy. A soft X‐ray fluorescence measurement setup has been implemented in order to provide the elemental distribution of thicker samples as well as chemical state information with a space resolution of ∼50 nm. A ptychography setup has been implemented in order to improve the space resolution down to 10 nm. Hardware setups and application activities of the STXM are presented.