On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex. (5th April 2018)
- Record Type:
- Journal Article
- Title:
- On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex. (5th April 2018)
- Main Title:
- On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex
- Authors:
- Luchkin, Sergey Y.
Stevenson, Keith J. - Abstract:
- Abstract: In this work we analyzed the effect of the atomic force microscopy probe tip apex shape on Kelvin Probe Force Microscopy (KPFM) potential sensitivity and spatial resolution. It was found that modification of the apex shape from spherical to planar upon thinning of the conductive coating leads to enhanced apex contribution to the total electrostatic force between the probe and the sample. The effect results in extended potential sensitivity and spatial resolution of KPFM. Experimental results were supported by calculations.
- Is Part Of:
- Microscopy and microanalysis. Volume 24:Number 2(2018)
- Journal:
- Microscopy and microanalysis
- Issue:
- Volume 24:Number 2(2018)
- Issue Display:
- Volume 24, Issue 2 (2018)
- Year:
- 2018
- Volume:
- 24
- Issue:
- 2
- Issue Sort Value:
- 2018-0024-0002-0000
- Page Start:
- 126
- Page End:
- 131
- Publication Date:
- 2018-04-05
- Subjects:
- AFM, -- KPFM, -- electrostatic force, -- tip geometry, -- resolution
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82 - Journal URLs:
- https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗ - DOI:
- 10.1017/S1431927618000156 ↗
- Languages:
- English
- ISSNs:
- 1431-9276
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD Digital store
- Ingest File:
- 6416.xml