Cite
HARVARD Citation
Li, P. et al. (2015). Impact of substrate resistance and layout on passivation etch-induced wafer arcing and reliability. Microelectronics and reliability. 55 (6), pp. 931-936. [Online].
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Li, P. et al. (2015). Impact of substrate resistance and layout on passivation etch-induced wafer arcing and reliability. Microelectronics and reliability. 55 (6), pp. 931-936. [Online].