Cite
HARVARD Citation
Qi, C. et al. (2015). Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology. Microelectronics and reliability. 55 (6), pp. 863-872. [Online].
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Qi, C. et al. (2015). Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology. Microelectronics and reliability. 55 (6), pp. 863-872. [Online].