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HARVARD Citation
Makovejev, S. et al. (2015). Wide frequency band assessment of 28 nm FDSOI technology platform for analogue and RF applications. Solid-state electronics. pp. 47-52. [Online].
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Makovejev, S. et al. (2015). Wide frequency band assessment of 28 nm FDSOI technology platform for analogue and RF applications. Solid-state electronics. pp. 47-52. [Online].