Adhesive-Based Atom Probe Sample Preparation. (15th March 2018)

• Record Type: Journal Article
• Authors: Rout, Surya S.; Heck, Philipp R.; Zaluzec, Nestor J.; Isheim, Dieter; Miller, Dean J.; Seidman, David N.
• Is Part Of: Microscopy today. Volume 26:Number 2(2018)
• Page Start: 24
• Page End: 31
• Publication Date: 2018-03-15
• Subjects: atom-probe tomography (APT), -- specimen preparation, -- adhesive, -- scanning transmission electron microscopy ((S)TEM), -- Bristol iron meteorite; Microscope and microscopy -- Periodicals; 502.8
• DOI: 10.1017/S1551929518000238
• Languages: English
• ISSNs: 1551-9295

Abstract

Abstract: Abstract: We present a specimen preparation procedure for atom-probe tomography using SemGlu from Kleindiek Nanotechnik, an adhesive that hardens under electron beam irradiation. The SemGlu adhesive is used in place of focused-ion-beam-induced deposition of organo-metallic Pt, W, or C to form a bond between the sample and the substrate during the specimen preparation procedure. We demonstrate the utility of this adhesive-based specimen preparation technique with a correlated atom-probe tomography-scanning transmission electron microscopy study of the iron-nickel alloy kamacite (ferrite, ɑ-iron) in the Bristol iron meteorite and two steel specimens.