Temperature dependence of the critical points of monolayer MoS2 by ellipsometry. Issue 7 (8th August 2016)
- Record Type:
- Journal Article
- Title:
- Temperature dependence of the critical points of monolayer MoS2 by ellipsometry. Issue 7 (8th August 2016)
- Main Title:
- Temperature dependence of the critical points of monolayer MoS2 by ellipsometry
- Authors:
- Park, Han Gyeol
Kim, Tae Jung
Kim, Hwa Seob
Yoo, Chang Hyun
Barange, Nilesh S.
Le, Van Long
Kim, Hyoung Uk
Senthilkumar, Velusamy
Le, Chinh Tam
Kim, Yong Soo
Seong, Maeng-Je
Kim, Young Dong - Abstract:
- ABSTRACT: We report the complex pseudodielectric function of molybdenum disulfide (MoS2 ) monolayers for energies from 1.40 to 6.42 eV and temperatures from 35 to 350 K. MoS2 was grown as a continuous monolayer on a SiO2 /Si substrate in a two zone hot-wall furnace using a catalyst-free chemical vapor growth process. The monolayer was then transferred onto a sapphire substrate. We investigated the optical properties of MoS2 using a dual-rotating-compensator ellipsometer with the sample in ultrahigh vacuum to prevent degradation and to minimize condensation artifacts in the data at low sample temperatures. Critical-point (CP) energies were determined using numerically calculated second energy derivatives of the spectra. At low temperature, we observed a splitting of A -excitonic peak. This identifies the bound excitonic states, including negatively charged excitons, trion states in monolayer MoS2 . Splitting of the B -excitonic peak is also indicated. Blue shifts of the CP energies and enhanced structures with reduced electron–phonon interaction are observed as the temperature is lowered. The temperature dependences of the CP energies were fit to a phenomenological expression that contains the Bose–Einstein statistical factor and the temperature coefficient.
- Is Part Of:
- Applied spectroscopy reviews. Volume 51:Issue 7/9(2016)
- Journal:
- Applied spectroscopy reviews
- Issue:
- Volume 51:Issue 7/9(2016)
- Issue Display:
- Volume 51, Issue 7/9 (2016)
- Year:
- 2016
- Volume:
- 51
- Issue:
- 7/9
- Issue Sort Value:
- 2016-0051-NaN-0000
- Page Start:
- 621
- Page End:
- 635
- Publication Date:
- 2016-08-08
- Subjects:
- Molybdenum disulfide (MoS2) -- ellipsometry -- dielectric function -- temperature dependence -- critical point
Spectrum analysis -- Periodicals
535.84 - Journal URLs:
- http://www.tandfonline.com/ ↗
- DOI:
- 10.1080/05704928.2016.1166436 ↗
- Languages:
- English
- ISSNs:
- 0570-4928
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 1579.500000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 6278.xml