Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory. (January 2016)
- Record Type:
- Journal Article
- Title:
- Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory. (January 2016)
- Main Title:
- Sensitivity analysis of rectangular atomic force microscope cantilevers immersed in liquids based on the modified couple stress theory
- Authors:
- Lee, Haw-Long
Chang, Win-Jin - Abstract:
- Highlights: This article is to study the sensitivity of an AFM cantilevers in liquids. The modified couple stress theory is adopted to study the sensitivity. This theory is more suitable for micro-structures than classical continuum theory. The theory contains a material length scale parameter. The parameter is difficult to obtain by experimental measurements. The optimal method is used to estimate the material length scale parameter. Abstract: The modified couple stress theory is adopted to study the sensitivity of a rectangular atomic force microscope (AFM) cantilever immersed in acetone, water, carbon tetrachloride ( C C l 4 ), and 1-butanol. The theory contains a material length scale parameter and considers the size effect in the analysis. However, this parameter is difficult to obtain via experimental measurements. In this study, a conjugate gradient method for the parameter estimation of the frequency equation is presented. The optimal method provides a quantitative approach for estimating the material length scale parameter based on the modified couple stress theory. The results show that the material length scale parameter of the AFM cantilever immersed in acetone, C C l 4, water, and 1-butanol is 0, 25, 116.3, and 471 nm, respectively. In addition, the vibration sensitivities of the AFM cantilever immersed in these liquids are investigated. The results are useful for the design of AFM cantilevers immersed in liquids.
- Is Part Of:
- Micron. Volume 80(2016:Jan.)
- Journal:
- Micron
- Issue:
- Volume 80(2016:Jan.)
- Issue Display:
- Volume 80 (2016)
- Year:
- 2016
- Volume:
- 80
- Issue Sort Value:
- 2016-0080-0000-0000
- Page Start:
- 1
- Page End:
- 5
- Publication Date:
- 2016-01
- Subjects:
- 07.79.Lh -- 62.25.Jk -- 68.37.Ps
Atomic force microscope -- Sensitivity analysis -- A modified couple stress theory
Microscopy -- Periodicals
Electron Probe Microanalysis -- Periodicals
Microscopy -- Periodicals
Microscopie -- Périodiques
Microscopy
Periodicals
502.82 - Journal URLs:
- http://www.elsevier.com/homepage/elecserv.htt ↗
http://www.sciencedirect.com/science/journal/09684328 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.micron.2015.09.006 ↗
- Languages:
- English
- ISSNs:
- 0968-4328
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5759.300000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 6255.xml