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HARVARD Citation
Lee, C. et al. (2018). A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regression. Microelectronics and reliability. pp. 77-83. [Online].
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Lee, C. et al. (2018). A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regression. Microelectronics and reliability. pp. 77-83. [Online].