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HARVARD Citation
Li, L. et al. (2018). First principles calculations study of crystallographic orientation effects on SiC/Ti and SiC/Cr interfaces. Microelectronics and reliability. pp. 119-126. [Online].
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Li, L. et al. (2018). First principles calculations study of crystallographic orientation effects on SiC/Ti and SiC/Cr interfaces. Microelectronics and reliability. pp. 119-126. [Online].