Cite
HARVARD Citation
Tuan, F. et al. (2018). Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. Microelectronics and reliability. pp. 260-270. [Online].
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Tuan, F. et al. (2018). Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. Microelectronics and reliability. pp. 260-270. [Online].