Cite
HARVARD Citation
Palumbo, F. et al. (2018). Bimodal Dielectric Breakdown in Electronic Devices Using Chemical Vapor Deposited Hexagonal Boron Nitride as Dielectric. Advanced Electronic Materials. p. n/a. [Online].
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Palumbo, F. et al. (2018). Bimodal Dielectric Breakdown in Electronic Devices Using Chemical Vapor Deposited Hexagonal Boron Nitride as Dielectric. Advanced Electronic Materials. p. n/a. [Online].