Microstructure Characterization of Multilayer Thin Coatings ZrN/Si3N4 by X‐Ray Diffraction Using Noncoplanar Measurement Geometry. Issue 5 (27th December 2017)

• Record Type: Journal Article
• Authors: Vlasenko, Svetlana; Benediktovitch, Andrei; Ulyanenkov, Alex; Uglov, Vladimir; Abadias, Grégory; O'Connell, Jacques; van Vuuren, Arno Janse
• Is Part Of: Physica status solidi. Volume 215:Issue 5(2018)
• Page Start: n/a
• Page End: n/a
• Publication Date: 2017-12-27
• Subjects: ellipsoidal grains -- microstructure characterization -- multilayer thin coatings -- noncoplanar measurement geometry -- X‐ray diffraction; Solid state physics -- Periodicals; Solids -- Industrial applications -- Periodicals; 530.41
• DOI: 10.1002/pssa.201700670
• Languages: English
• ISSNs: 1862-6300

Abstract

Abstract : The structural characterization of multilayer thin coatings is performed by X‐ray diffraction using a noncoplanar measurement geometry. The application of such a measurement geometry enables a reliable and comprehensive microstructural analysis of the material comparing to other measurement geometries due to the accessibility to a larger number of measured Bragg reflections. The important advantage of noncoplanar geometry is a measurement setup without tilting and rotating the sample. A set of profiles for different Bragg reflections is measured for several multilayer coatings with different thicknesses of individual layers; the obtained profiles are combined into a single scan for the simultaneous fittingby a theoretical curve. The broadening of the diffraction profiles is considered to be affected by a small grain size and instrumental effects, with the grains being modeled by ellipsoidal shape with two equal in‐plane axes. Based on the proposed fitting procedure, the microstructural parameters of multilayer coatings are evaluated, including the grains size in parallel and normal to the surface directions. The dependence of evaluated grains size on the measurement direction confirms the validity of the selected grains model. The microstructural parameters evaluated from noncoplanar X‐ray diffraction show a good agreement with those obtained from HRTEM and STEM techniques. Abstract : The X‐ray diffraction using noncoplanar measurement geometry was used to evaluate the microstructural parameters of multilayer thin coatings ZrN/Si3 N4 – grains size in parallel and normal to the sample surface directions. The measured profiles were combined into a single scan for the simultaneous fitting with theoretically simulated curve. The results obtained are confirmed by those from HRTEM and STEM.