Young's moduli of sputter-deposited NiTi films determined by resonant ultrasound spectroscopy: Austenite, R-phase, and martensite. (May 2015)

• Record Type: Journal Article
• Authors: Thomasová, Martina; Sedlák, Petr; Seiner, Hanuš; Janovská, Michaela; Kabla, Meni; Shilo, Doron; Landa, Michal
• Is Part Of: Scripta materialia. Volume 101(2015)
• Page Start: 24
• Page End: 27
• Publication Date: 2015-05
• Subjects: Shape memory alloys -- Sputtering -- Elastic behavior -- Martensitic phase transformation -- Resonant ultrasound spectroscopy; Materials -- Periodicals; Metallurgy -- Periodicals; Metalen; Legeringen; Materiaalkunde; Metals, metalworking and machinery industries; Metals; Electronic journals; 620.11
• DOI: 10.1016/j.scriptamat.2015.01.009
• Languages: English
• ISSNs: 1359-6462

Abstract

Abstract : Young's moduli of 3 μm thick NiTi films sputter-deposited on silicon wafers are determined by resonant ultrasound spectroscopy. Three samples with different transition temperatures are studied; for each sample, the evolution of Young's modulus is obtained in a thermal cycle covering the austenite → R-phase → martensite transition sequence. The results prove that the smallest Young's modulus is attained for the R-phase, and both austenite and martensite exhibit pronounced softening towards the transition temperatures.