Cite
HARVARD Citation
Qin, W. et al. (2018). Quick and cost-efficient A/D converter static characterization using low-precision testing signal. Microelectronics journal. pp. 86-93. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Qin, W. et al. (2018). Quick and cost-efficient A/D converter static characterization using low-precision testing signal. Microelectronics journal. pp. 86-93. [Online].