Measurement of relative depth-dose distribution in radiochromic film dosimeters irradiated with 43–70 keV electron beam for industrial application. (May 2018)
- Record Type:
- Journal Article
- Title:
- Measurement of relative depth-dose distribution in radiochromic film dosimeters irradiated with 43–70 keV electron beam for industrial application. (May 2018)
- Main Title:
- Measurement of relative depth-dose distribution in radiochromic film dosimeters irradiated with 43–70 keV electron beam for industrial application
- Authors:
- Matsui, Shinjiro
Hattori, Takeaki
Nonaka, Takashi
Watanabe, Yuki
Morita, Ippei
Kondo, Junichi
Ishikawa, Masayoshi
Mori, Yoshitaka - Abstract:
- Abstract: The relative dose in a layer, which is thinner than the thickness of the dosimeter is evaluated using simulated depth-dose distributions, and the measured responses of dosimeters with acceleration voltages from 43 to 70 kV, via ultra-low-energy electron beam (ULEB) irradiation. By stacking thin film dosimeters, we confirmed that the simulated depth-dose distributions coincided with the measured depth-dose curve within the measurement uncertainty ( k = 2 ). Using the measurement dose of the 47 μm dosimeter and the simulated depth-dose distribution, the dose of 11 μm dosimeters in the surface was evaluated within the measurement uncertainty ( k = 2 ). We also verified the effectiveness of this method for a thinner layer by changing the acceleration voltage of the irradiation source. We evaluated the relative dose for an adjusted depth of energy deposition from 4.4 μm to 22.8 μm. As a result, this method was found to be effective for a thickness, which is less than the thickness of the dosimeter. When irradiation conditions are well known with accuracy, using the confirmed relative depth-dose distributions across any dosimeter thickness range, a dose evaluation, in several μm steps will possibly improve the design of industrial ULEB processes. Abstract : Highlights: A method for a relative dose estimation in industrial ULEB process is proposed. The simulated depth-dose curve is effective for a dose evaluation. This method is confirmed within the energy deposit rangeAbstract: The relative dose in a layer, which is thinner than the thickness of the dosimeter is evaluated using simulated depth-dose distributions, and the measured responses of dosimeters with acceleration voltages from 43 to 70 kV, via ultra-low-energy electron beam (ULEB) irradiation. By stacking thin film dosimeters, we confirmed that the simulated depth-dose distributions coincided with the measured depth-dose curve within the measurement uncertainty ( k = 2 ). Using the measurement dose of the 47 μm dosimeter and the simulated depth-dose distribution, the dose of 11 μm dosimeters in the surface was evaluated within the measurement uncertainty ( k = 2 ). We also verified the effectiveness of this method for a thinner layer by changing the acceleration voltage of the irradiation source. We evaluated the relative dose for an adjusted depth of energy deposition from 4.4 μm to 22.8 μm. As a result, this method was found to be effective for a thickness, which is less than the thickness of the dosimeter. When irradiation conditions are well known with accuracy, using the confirmed relative depth-dose distributions across any dosimeter thickness range, a dose evaluation, in several μm steps will possibly improve the design of industrial ULEB processes. Abstract : Highlights: A method for a relative dose estimation in industrial ULEB process is proposed. The simulated depth-dose curve is effective for a dose evaluation. This method is confirmed within the energy deposit range of 4.4 µm or more. This method works if irradiation conditions are known with accuracy. … (more)
- Is Part Of:
- Radiation physics and chemistry. Volume 146(2018:May)
- Journal:
- Radiation physics and chemistry
- Issue:
- Volume 146(2018:May)
- Issue Display:
- Volume 146 (2018)
- Year:
- 2018
- Volume:
- 146
- Issue Sort Value:
- 2018-0146-0000-0000
- Page Start:
- 91
- Page End:
- 95
- Publication Date:
- 2018-05
- Subjects:
- Ultra-low energy electron-beam -- Radiochromic film -- PENELOPE
Radiation chemistry -- Periodicals
Radiometry -- Periodicals
Radiation -- Periodicals
Chimie sous rayonnement -- Périodiques
539.2 - Journal URLs:
- http://www.sciencedirect.com/science/journal/0969806X ↗
http://www.elsevier.com/journals ↗
http://www.journals.elsevier.com/radiation-physics-and-chemistry/ ↗ - DOI:
- 10.1016/j.radphyschem.2018.01.006 ↗
- Languages:
- English
- ISSNs:
- 0969-806X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 7227.984000
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